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Advanced TEM Characterization for the Materials Scientist

Materials Today | Archived Webinar : November 3, 2015

 
 

Advances in imaging performance and analytical capabilities, combined with the way in which detectors are accessed, have led to the ability for materials scientists, rather than electron microscopists, to obtain the highest quality data for their characterization needs at the sub-nanometer scale.

See how even novice users at EPFL (École Polytechnique Fédérale de Lausanne, Switzerland) were able to acquire high-quality data without arduous and time-consuming alignment procedures. EPFL researchers can now spend more time interpreting and analyzing data thanks to more experiment cycles on the TEM.

Additionally, we will present results obtained on nanostructured materials using the advanced EDS system that enables the acquisition of chemical data sets in 3D.

In this webinar, you will:

  • Hear from leading researchers on how productivity in their university microscopy center has increased significantly.
  • Learn about the application of the latest technologies to the characterization of nanostructured materials.
  • See how dynamic high-resolution imaging capabilities paired with fast, automated data acquisition enable you to easily characterize the chemical composition of nanomaterials in 3D.

 

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